Statistical and System Transfer Function Based Method For Jitter and Noise In Communication Design and Test

As the communication speed/data rate approaches 1 Gb/s and beyond, timing jitter and amplitude noise become the major limiting factors for system performance. Traditional methods used in simulating, analyzing, modeling, and quantifying jitter and noise in terms of peak-to-peak and/or rms becomes no longer accurate and sufficient. As such, new methods with better accuracy and comprehension are called for. In this paper, we will first illustrate shortfalls of using simple parametric based method such as peak-to-peak or rms in quantifying jitter and noise. We then will discuss new jitter and noise modeling and analysis methods for both design and test based on statistical signal theory invoking probability density function (pdf) and cumulative distribution function (cdf) and the corresponding component distributions of deterministic and random to quantify jitter, noise, and Bit Error Rate (BER) for communication systems. Thirdly, we will introduce jitter and noise transfer functions and their important roles-played in estimating relevant jitter, noise, and BER in the system. Fourthly, we will introduce and illustrate how those methods can be used in designing and testing > 1 Gb/s communication systems, such as Fibre Channel (FC), Giga Bit Ethernet (GBE), and PCI Express. Dr. Mike Li is currently the Chief Technology Officer (CTO) with Wavecrest. Dr. Li pioneered jitter separation method (Tailfit) and DJ, RJ, and TJ concept and theory formation. He has involved in setting and contributed to standards for jitter, noise, and signal integrity for leading serial data communications, such as Fibre Channel, Gigabit Ethernet, Serial ATA, and PCI Express. Currently he is Co-Chairman for PCI Express jitter standard committee. Dr. Li has more than 10 years experiences in high-speed related measurement instrumentation, testing, and analysis/modeling algorithms/tools, with applications in IC, microprocessor, clock, serial data communications for both electrical and optical, and wireless communication. Prior joining Wavecrest, Dr. Li had worked in both industry and academic institution. Dr. Li is experienced in measurement system and Automated Test Equipment (ATE) architectures, hardware, software, performance, and accuracy. He has a BS in physics from University of Science and Technology of China, a MSE in electrical engineering and a Ph.D. in physics from University of Alabama in Huntsville. He did his Post Dr. at University of California, Berkeley and worked there as a research scientist on high-energy astrophysics before he joined industry. Dr Li has published more than 40 papers in refereed technical journals, holds one patent and has four patents pending. …